The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 09, 2022
Filed:
Jul. 16, 2019
Centre National DE LA Recherche Scientifique, Paris, FR;
Ecole Supérieure DE Physique ET DE Chimie Industrielles DE LA Ville DE Paris, Paris, FR;
Alexandre Aubry, Ivry-sur-Seine, FR;
Amaury Badon, Brookline, MA (US);
Victor Barolle, Saint Cloud, FR;
Claude Boccara, Paris, FR;
Laura Cobus, Paris, FR;
Mathias Fink, Meudon, FR;
William Lambert, Paris, FR;
Abstract
The present invention relates to a method for the non-invasive optical characterization of a heterogeneous medium, comprising: a step of illuminating, by means of a series of incident light waves, a given field of view of the heterogeneous medium, positioned in a focal plane of a microscope objective (); a step of determining a first distortion matrix (D, D) in an observation basis defined between a conjugate plane of the focal plane (FP) and an observation plane, said first distortion matrix corresponding, in a correction basis defined between a conjugate plane of the focal plane and an aberration correction plane, to the term-by-term matrix product of a first reflection matrix (R) of the field of view, determined in the correction basis, with the phase conjugate matrix of a reference reflection matrix, defined for a model medium, in said correction basis; and a step of determining, from the first distortion matrix, at least one mapping of a physical parameter of the heterogeneous medium.