The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Mar. 11, 2021
Keysight Technologies, Inc., Santa Rosa, CA (US);
Winston Wencheng Liu, Woodland Hills, CA (US);
Konstantin Belov, Thousand Oaks, CA (US);
Matthew R. Bergeron, Sunol, CA (US);
KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);
Abstract
According to one method, the method occurs at a test system implemented using at least one processor. The method includes receiving test configuration information associated with a test session for configuring a test infrastructure connecting at least one test application and a system under test (SUT), wherein the test infrastructure includes at least two CTI devices that are dynamically configurable to perform one or more test related functions; configuring, using test configuration information, the test infrastructure to handle traffic for the test session; initiating the test session, wherein the test session involves using the at least two CTI devices and the at least one test application to test the SUT; and obtaining and reporting test results associated with the test session.