The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2022

Filed:

Mar. 15, 2019
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Hiromoto Inoue, Tokyo, JP;

Shinichi Hosomi, Tokyo, JP;

Yoshitatsu Kawama, Tokyo, JP;

Takaki Sugino, Tokyo, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/16 (2006.01); H01L 35/34 (2006.01); H01L 37/02 (2006.01); H01L 35/28 (2006.01); H01L 23/528 (2006.01); G01J 5/12 (2006.01); H01L 35/22 (2006.01);
U.S. Cl.
CPC ...
H01L 27/16 (2013.01); G01J 5/12 (2013.01); H01L 23/528 (2013.01); H01L 35/22 (2013.01); H01L 35/28 (2013.01); H01L 35/34 (2013.01); H01L 37/025 (2013.01); G01J 2005/123 (2013.01);
Abstract

Connection with a wiring structure can be reliably achieved, whereby a semiconductor sensor device and a semiconductor sensor device manufacturing method with increased reliability are provided. A semiconductor sensor device in which a multiple of signal lines and a sensor detection portion are disposed includes a conductive film, disposed on a substrate, that configures the signal lines and whose upper face is exposed by an aperture portion of a width smaller than a width of the signal lines, a conductive member formed on the conductive film and electrically connected to the conductive film via the aperture portion, and a wiring structure, formed on an upper face of the conductive member, of an air bridge structure that connects the signal lines or the signal lines and the sensor detection portion, wherein an upper surface of the conductive member is in contact with the wiring structure, and a side face is exposed.


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