The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Feb. 22, 2019
Applicant:
Hitachi High-tech Corporation, Tokyo, JP;
Inventors:
Anoru Suga, Tokyo, JP;
Shuhei Yabu, Tokyo, JP;
Assignee:
Hitachi High-Tech Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/073 (2006.01); H01J 37/22 (2006.01); H01J 37/244 (2006.01); H01J 37/28 (2006.01);
U.S. Cl.
CPC ...
H01J 37/073 (2013.01); H01J 37/222 (2013.01); H01J 37/244 (2013.01); H01J 37/28 (2013.01); H01J 2237/2448 (2013.01); H01J 2237/24592 (2013.01);
Abstract
An object of the present invention is to reduce the possibility that a filament is broken during observation and a re-measurement is required, to reduce the running cost of an apparatus, and to improve the operating efficiency of the apparatus. The charged particle beam apparatus according to the present invention calculates an imaging time required to generate an observation image of a sample and estimates a remaining usable time of the filament, and when the imaging time is longer than the remaining usable time, presents the fact (see FIG.).