The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2022

Filed:

Jul. 11, 2019
Applicant:

Canon Medical Systems Corporation, Otawara, JP;

Inventors:

Tzu-Cheng Lee, Vernon Hills, IL (US);

Jian Zhou, Vernon Hills, IL (US);

Zhou Yu, Vernon Hills, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 11/00 (2006.01); G06T 5/20 (2006.01); G06T 5/00 (2006.01); G01N 23/046 (2018.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
G06T 11/006 (2013.01); A61B 6/032 (2013.01); A61B 6/037 (2013.01); G01N 23/046 (2013.01); G06T 5/002 (2013.01); G06T 5/20 (2013.01); G06T 11/005 (2013.01); G01N 2223/401 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10104 (2013.01); G06T 2207/10108 (2013.01); G06T 2207/10121 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30004 (2013.01); G06T 2210/41 (2013.01); G06T 2211/421 (2013.01);
Abstract

A method and apparatus is provided to improve the image quality of images generated by analytical reconstruction of a computed tomography (CT) image. This improved image quality results from a deep learning (DL) network that is used to filter a sinogram before back projection but after the sinogram has been filtered using a ramp filter or other reconstruction kernel.


Find Patent Forward Citations

Loading…