The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2022

Filed:

Oct. 03, 2019
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventor:

Yuuki Sugita, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/80 (2017.01); B23Q 17/22 (2006.01); G01B 11/03 (2006.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); B23Q 17/2233 (2013.01); G01B 11/03 (2013.01); G06T 2207/30108 (2013.01);
Abstract

To provide a camera calibration device and a camera calibration method which can easily calibrate a relationship between a machine coordinate system of a machine tool and a camera coordinate system of a camera. A camera calibration device calibrates an imaging means of a machine tool, the machine tool includes: a touch probe which acquires one point whose machine coordinates are known; a camera which images the one point and a pattern including a feature used for calibration; and a drive mechanism which moves a table or a spindle in two orthogonal directions and an image obtained by imaging the one point and the pattern and images obtained by imaging the pattern or/and the one point when the table or a machining machine is moved in the two directions are used to calculate an external parameter by calculating a positional posture relationship between the machine coordinate system and the pattern.


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