The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2022

Filed:

Aug. 22, 2017
Applicant:

Iris International, Inc., Chatsworth, CA (US);

Inventors:

Carlos Ramirez, Miami, FL (US);

Steven Cadavid, Delray Beach, FL (US);

Jindan Zhou, Miami, FL (US);

Assignee:

Iris International, Inc., Chatsworth, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G16H 30/40 (2018.01); G16H 10/40 (2018.01); G06T 7/33 (2017.01); G06T 7/41 (2017.01); G16B 5/00 (2019.01); G16B 50/30 (2019.01); G16B 40/10 (2019.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 7/001 (2013.01); G06T 7/33 (2017.01); G06T 7/41 (2017.01); G16B 5/00 (2019.02); G16B 40/10 (2019.02); G16B 50/30 (2019.02); G16H 10/40 (2018.01); G16H 30/40 (2018.01);
Abstract

A method and system for classification of cells and particles in a biological sample using an automated image-based feature extraction and classification architecture. A method operates by applying a mask or series of masks to an image, extracting features from the unmasked portions of the image based on the content and location of colored pixels, selecting a subset of the extracted features, and mapping the subset of the extracted features into a classifier architecture. In a majority of cases, the first level model architecture provides an accurate identification of the cell or particle. In a minority of cases, the classification of the cell or particle requires a second level step requiring the use of numerical or categorical values from the first level in combination with a second level model.


Find Patent Forward Citations

Loading…