The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Apr. 12, 2019
General Electric Company, Schenectady, NY (US);
Nicholas Anthony Stancato, Skaneateles, NY (US);
Melissa Rose Stancato, Skaneateles, NY (US);
Kevin Andrew Coombs, Skaneateles, NY (US);
Joseph John Waclawski, Skaneateles, NY (US);
James J. Delmonico, Skaneateles, NY (US);
Bryan David Maule, Skaneateles, NY (US);
Dennis Lavin, Syracuse, NY (US);
Matthew William Pankow, Skaneateles, NY (US);
BAKER HUGHES, A GE COMPANY, LLC, Houston, TX (US);
Abstract
Methods, systems, and computer-readable media for articulating visual inspection devices are provided. For example, a method can include receiving an inspection template by a control system associated with the visual inspection device. The inspection template can include data associated with at least one point of interest in a scene viewable to the visual inspection device. The method can further include generating, by the control system, an articulation path based on the data. The method can also include actuating an electro-mechanical system of the visual inspection device according to the articulation path.