The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Sep. 26, 2019
Beijing Boe Optoelectronics Technology Co., Ltd., Beijing, CN;
Boe Technology Group Co., Ltd., Beijing, CN;
Hongzhen Xue, Beijing, CN;
Fuqiang Ma, Beijing, CN;
Minglei Chu, Beijing, CN;
Jiankang Sun, Beijing, CN;
Guobing Yin, Beijing, CN;
Zehua Dong, Beijing, CN;
Lili Chen, Beijing, CN;
BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Abstract
The present disclosure provides a method, apparatus, and measurement device for measuring distortion parameters of a display device, and a computer-readable medium. The display device includes a display screen and a lens located on a light exiting side of the display screen, and the method includes: acquiring a distortion image which is generated by imaging an initial image through the lens, wherein the initial image is an image displayed on the display screen, the initial image comprises a plurality of first corner points, and the distortion image comprises a plurality of second corner points which match the plurality of first corner points respectively; and determining the distortion parameters of the display device according to a locational relationship between the second corner points and a first corner points which match the second corner points.