The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2022

Filed:

May. 30, 2019
Applicant:

Walmart Apollo, Llc, Bentonville, AR (US);

Inventors:

Jagdish Ramakrishnan, Foster City, CA (US);

Elham Shaabani, Redwood City, CA (US);

Chao Li, San Carlos, CA (US);

Matyas A. Sustik, San Francisco, CA (US);

Assignee:

Walmart Apollo, LLC, Bentonville, AR (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 30/02 (2012.01); G06Q 10/06 (2012.01); G06K 9/62 (2022.01); G06Q 20/20 (2012.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06Q 30/0283 (2013.01); G06K 9/6257 (2013.01); G06K 9/6262 (2013.01); G06N 20/00 (2019.01); G06Q 10/06312 (2013.01); G06Q 20/201 (2013.01);
Abstract

This application relates to apparatus and methods for identifying anomalies within data, such as pricing data. In some examples, a computing device receives data updates and selects a machine learning model to apply to the data update. The computing device may train the machine learning model with features generated based on historical purchase order data. An anomaly score is generated based on application of the machine learning model. Based on the anomaly score, the data update is either allowed, or denied. In some examples, the computing device re-trains the machine learning model with detected anomalies. In some embodiments, the computing device prioritizes detected anomalies for further investigation. In some embodiments, the computing device identifies the cause of the anomalies by identifying at least one feature that is causing the anomaly.


Find Patent Forward Citations

Ramakrishnan, Jagdish. (2022). Methods and apparatus for anomaly detections (U.S. Patent No. 11403682). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11403682

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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