The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2022

Filed:

Jan. 29, 2019
Applicant:

The Johns Hopkins University, Baltimore, MD (US);

Inventors:

Matthew B. Wagner, Glenwood, MD (US);

David R. Witman, Halethorpe, MD (US);

Peter A. Sevich, Gaithersburg, MD (US);

Patrick J. Trainor, Baltimore, MD (US);

Liam R. Cusack, Columbia, MD (US);

William A. Patterson, Reisterstown, MD (US);

Assignee:

The Johns Hopkins University, Baltimore, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 30/20 (2020.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 30/20 (2020.01);
Abstract

An artificial intelligence testing apparatus may include processing circuitry configured to execute instructions that, when executed, cause the apparatus to create initial sample points based on a simulation received at the apparatus, and employ cyclic evaluation of the simulation until a stopping criteria is met. Employing the cyclic evaluation includes running the simulation at design points for a set of queries associated with a current iteration of the cyclic evaluation, training a set of meta-models of parameter space associated with the simulation for the current iteration, computing a set of metrics for the current iteration, and employing a selected sampling approach to select a new set of design points for a next iteration of the cyclic evaluation.


Find Patent Forward Citations

Wagner, Matthew. (2022). Method and apparatus for providing efficient testing of systems by using artificial intelligence tools (U.S. Patent No. 11403554). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11403554

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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