The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2022

Filed:

Jul. 18, 2019
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Peter Meier, Los Gatos, CA (US);

Tanmay Batra, Mountain View, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2006.01); G06N 3/08 (2006.01); G06K 9/62 (2022.01); G06T 7/70 (2017.01); G06T 7/10 (2017.01); G06T 7/20 (2017.01);
U.S. Cl.
CPC ...
G06N 3/0454 (2013.01); G06K 9/6267 (2013.01); G06N 3/08 (2013.01); G06T 7/10 (2017.01); G06T 7/20 (2013.01); G06T 7/70 (2017.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/20132 (2013.01);
Abstract

In some implementations at an electronic device, training a dual EDNN includes defining a data structure of attributes corresponding to defined parts of a task, processing a first instance of an input using a first EDNN to produce a first output while encoding a first set of the attributes in a first latent space, and processing a second instance of the input using a second EDNN to produce a second output while encoding attribute differences from attribute averages in a second latent space. The device then determines a second set of the attributes based on the attribute differences and the attribute averages. The device then adjusts parameters of the first and second EDNNs based on comparing the first instance of the input to the first output, the second instance of the input to the second output, and the first set of attributes to the second set of attributes.


Find Patent Forward Citations

Loading…