The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Mar. 08, 2018
Siemens Aktiengesellschaft, Munich, DE;
Yi Xu, Ithaca, NY (US);
Sanjeev Srivastava, Princeton Junction, NJ (US);
Lucia Mirabella, Plainsboro, NJ (US);
David Madeley, Louth, GB;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A method of optimizing an additive manufacturing (AM) process includes receiving at least one design parameter of the AM process, receiving information relating to uncertainty in at least one other parameter of the AM process, performing uncertainty quantification in the optimization processor based on the at least one design parameters and uncertainty information to identify a shape error in an object being produced, updating the at least one design parameter of the AM process and utilizing the updated at least one design parameter in the AM process. A system for optimizing an AM process includes a design processor to produce at least one design parameter for an object to be manufactured, and an optimization processor to receive the at least one design parameter and uncertainty information to identify a shape error in the object to be manufactured and update the design parameters based on the shape error, prior or during the manufacturing process.