The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Apr. 14, 2020
Oracle International Corporation, Redwood Shores, CA (US);
William Martinez Cortes, Jalisco, MX;
Shasank Kisan Chavan, Menlo Park, CA (US);
Siva Ravada, Nashua, NH (US);
Ying Hu, Nashua, NH (US);
ORACLE INTERNATIONAL CORPORATION, Redwood Shores, CA (US);
Abstract
Techniques described herein perform spherical PIP analysis by detecting whether a test ray (defined by a test point (TP) and a point (EP) that is external to a spherical polygon) crosses edge arcs ('edges') of the polygon based on relative orientations of vertices of the test ray and edges. A classifier vector (CV) for a test ray is calculated based on the cross-product of the TP and the EP. Using the CV, the orientation of each vertex of the polygon with respect to the test ray is determined. Candidate edges having vertices with opposite orientations with respect to the test ray are identified. Crossing edges are determine by calculating CVs for each candidate edge, and determining orientations of the TP and EP with respect to each candidate edge. A set of crossing edges is determined, where the TP and the EP have opposite orientations with respect to each crossing edge.