The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2022

Filed:

May. 10, 2019
Applicant:

Hangzhou Fabu Technology Co., Ltd., Hangzhou, CN;

Inventors:

Xiaofei He, Hangzhou, CN;

Siddartha Kavilipati, Tempe, AZ (US);

Bahaa Osman, Tempe, AZ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/36 (2006.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3636 (2013.01); G06N 3/04 (2013.01);
Abstract

Provided are a method and an apparatus for debugging, and a system on chip. The method for debugging includes: a component to be debugged receives a debugging instruction from a controller, and the component to be debugged performs debugging operation according to the debugging instruction and configuration of a state machine inside the component to be debugged. Then an SW level debugging operation of component on system on chip can be achieved, which improves the debugging efficiency of these components with large amounts of data flow on system on chip.


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