The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Oct. 30, 2020
Seiko Epson Corporation, Tokyo, JP;
Junichi Wakabayashi, Ueda, JP;
Akihide Haruyama, Suwa, JP;
Seiko Epson Corporation, Tokyo, JP;
Abstract
A microlens array substrate includes a substrate having a first surface and a plurality of recesses corresponding to a plurality of pixels, and a microlens array including a plurality of microlenses corresponding to the plurality of recesses. The microlenses each have a refractive index different from a refractive index of the substrate, and each have a light incident surface and a light exiting surface. The light incident surface has a first curvature region and a second curvature region. The second curvature region surrounds the first curvature region when viewed along the optical axis of one microlens and has a curvature greater than the curvature of the first curvature region. The light exiting surface includes a light collecting structure configured to converge the light incident via the light incident surface. The light collecting structure overlaps with part of the first curvature region when viewed along the optical axis.