The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Sep. 10, 2018
Chongqing Boe Optoelectronics Technology Co., Ltd., Chongqing, CN;
Boe Technology Group Co., Ltd., Beijing, CN;
Lang Hu, Beijing, CN;
Yaohua Jiang, Beijing, CN;
Yang Yu, Beijing, CN;
Kaiqiang Li, Beijing, CN;
Chaolei Wang, Beijing, CN;
Nannan Rong, Beijing, CN;
Yan Yang, Beijing, CN;
CHONGQING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD., Chongqing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
Abstract
A repairing method for an array substrate is provided. The array substrate includes at least one defective signal line, which is a data line or a gate line having a breakpoint. The defective signal line is divided by the breakpoint into a first portion and a second portion. The repairing method includes disconnecting a connection between a first thin film transistor and a data line or a gate line to which the first thin film transistor is connected, the first thin film transistor being a thin film transistor closest to the breakpoint among thin film transistors connected to the first portion; electrically connecting a first terminal of the first thin film transistor to the first portion; and taking a common electrode line segment from a common electrode line to which the first pixel electrode corresponds as a repair line.