The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2022

Filed:

Jan. 09, 2020
Applicant:

Saudi Arabian Oil Company, Dhahran, SA;

Inventors:

Hongwei Liu, Dhahran, SA;

Yi Luo, Dhahran, SA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/30 (2006.01); G01V 1/34 (2006.01);
U.S. Cl.
CPC ...
G01V 1/302 (2013.01); G01V 1/345 (2013.01); G01V 2210/48 (2013.01); G01V 2210/643 (2013.01);
Abstract

A process for seismic imaging of a subterranean geological formation includes generating a source wavefield from seismic data representing a subterranean formation. The process includes generating a receiver wavefield from the seismic data representing the subterranean formation. The process includes decomposing the source wavefield to extract a source depth component and decomposing the receiver wavefield to extract a receiver depth component. The process includes applying a transform to each of the source depth component and the receiver depth component. The process includes combining the source depth component and the receiver depth component to generate an imaging condition. The process includes extracting a low-frequency term from the imaging condition to generate a wave-path tracking data, generating a wave path from the wave-path tracking data, and rendering a seismic image of at least a portion of the subterranean geological formation from the generated wave path.


Find Patent Forward Citations

Liu, Hongwei. (2022). Identifying geologic features in a subterranean formation using seismic diffraction and refraction imaging (U.S. Patent No. 11402529). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11402529

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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