The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Oct. 03, 2017
Siemens Healthcare Gmbh, Erlangen, DE;
Grzegorz Soza, Heroldsberg, DE;
Sebastian Schmidt, Weisendorf, DE;
Siemens Healthcare GmbH, Erlangen, DE;
Abstract
A method is for using measurement data of an object of examination for a post-processing process. In an embodiment, the method includes recording first measurement data, the first measurement data being previously determined via a medical imaging modality; automatically analyzing the first measurement data based on defined criteria and automatically inspecting a set of control parameters with aid of an analysis of the first measurement data using defined criteria with regard to second measurement data, the second measurement data being previously recorded via the modality using the set of control parameters, wherein the defined criteria include at least one of a post-processing capacity and identification of at least one image characteristic; and using at least one of the first measurement data and the second measurement data in a post-processing process. A control device and a medical imaging system are also disclosed.