The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Aug. 06, 2020
Scan Systems, Corp, The Woodlands, TX (US);
SCAN SYSTEMS CORP., The Woodlands, TX (US);
Abstract
Tubular member inspection apparatus, systems and methods for inspecting tubulars of a variety of diameters. An EMI inspection shoe includes a flexible, generally arcuate body having a leading end, a trailing end, a non-working major face, and a working major face. The leading end, trailing end, non-working major face, and working major face at least partially define an inspection zone therebetween. One or more magnetic flux detectors are carried by the flexible, generally arcuate body in the inspection zone. One or more pressure actuators removably attached to the non-working face are configured to exert pressure on one or more regions of the flexible, generally arcuate body in the inspection zone during an EMI inspection of a tubular, forcing the flexible, generally arcuate body to contort into a generally contoured shape as it passes over a contoured region of the tubular.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile