The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Sep. 25, 2020
Hong Kong Applied Science and Technology Research Institute Co., Ltd., Shatin, HK;
Zhinan Yu, Shatin, HK;
Chun Chung Chan, Tseuen Wan, HK;
Jiangquan Mai, Shatin, HK;
Fangyi Shi, Hung Hom, HK;
Abstract
Systems and methods in which multi-dimensional metric monitoring is used with respect to multi-wavelength scattering for smoke detection are described. A multi-dimensional metric may dynamically track a slope of a relationship between scattered light of multiple wavelengths of scattered light being monitored. A multi-dimensional metric monitoring smoke detection algorithm may utilize multi-dimensional thresholds with respect to monitoring of the multi-dimensional metric for initiating a fire alarm and resetting the fire alarm. An optical measuring chamber utilized for providing multi-wavelength scattering signals utilized in deriving a multi-dimensional metric for smoke detection may be configured for wide-scattering-angle signal collection, such as using a light trapping sub-chamber having a light-guide diaphragm assembly configured for wide-scattering-angle signal collection.