The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2022

Filed:

Jun. 13, 2019
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Shigeki Shinoda, Tokyo, JP;

Hirofumi Inoue, Tokyo, JP;

Junichiro Mataga, Tokyo, JP;

Takahiro Kumura, Tokyo, JP;

Katsumi Kikuchi, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 3/24 (2006.01); G01M 3/22 (2006.01);
U.S. Cl.
CPC ...
G01M 3/24 (2013.01); G01M 3/22 (2013.01); G01M 3/243 (2013.01);
Abstract

A leakage inspection device according to an aspect of the present disclosure includes: at least one memory storing a set of instructions; and at least one processor configured to execute the set of instructions to: determine a measurement time; measure vibration waveforms for the measurement time by using at least two sensors set to a pipe; calculate a cross-correlation function of the measured vibration waveforms; detect peaks of the cross-correlation function at least twice in the measurement time; and determine that leakage occurs in a case where the peaks are repeatedly detected in the measurement time.


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