The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2022

Filed:

Dec. 11, 2018
Applicant:

Topcon Corporation, Tokyo-to, JP;

Inventors:

Fumio Ohtomo, Saitama, JP;

Tetsuji Anai, Tokyo-to, JP;

Kaoru Kumagai, Tokyo-to, JP;

Assignee:

TOPCON Corporation, Tokyo-to, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 15/00 (2006.01); G01C 5/00 (2006.01);
U.S. Cl.
CPC ...
G01C 15/006 (2013.01); G01C 5/00 (2013.01); G01C 15/002 (2013.01); G01C 15/008 (2013.01);
Abstract

A surveying instrument comprises a monopod installed on a reference point, a surveying instrument main body having a reference optical axis and an operation panel, wherein the surveying instrument main body has a distance measuring unit, an arithmetic control module, a measuring direction image pickup module which acquires a first image, and an attitude detector which detects tilts of two axes of the surveying instrument main body to the horizontal, and wherein the operation panel has a display unit, a calculating module, and as operation module, and the at least either one of the arithmetic control module and the calculating module calculates a tilt angle of the reference optical axis to the horizontal and a tilt angle of the monopod to the vertical, and the at least either one measures a horizontal distance and a vertical distance to the object to be measured with reference to the reference point.


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