The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 02, 2022

Filed:

Nov. 09, 2017
Applicant:

Renishaw Plc, Wotton-under-Edge, GB;

Inventors:

Martin Simon Rees, Thornbury, GB;

Toby John Main, Bristol, GB;

James Arash Shabani, Bristol, GB;

Assignee:

RENISHAW PLC, Wotton-under-Edge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/008 (2006.01); G01B 21/04 (2006.01); G05B 19/401 (2006.01);
U.S. Cl.
CPC ...
G01B 21/042 (2013.01); G01B 5/008 (2013.01); G05B 19/401 (2013.01); G05B 2219/37193 (2013.01); G05B 2219/39019 (2013.01);
Abstract

A method of calibrating a contact probe having a deflectable stylus and configured to provide at least one signal which is indicative of the extent of deflection of the stylus, the contact probe being mounted on a coordinate positioning machine which facilitates reorientation of the contact probe about at least one axis. The method includes: taking measurement data obtained with the contact probe positioned at a plurality of different orientations about the at least one axis; and determining from the measurement data at least one gain variation model which models any apparent variation in the gain of the at least one probe signal dependent on the orientation of the contact probe about the at least one axis.


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