The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Apr. 21, 2020
China University of Mining and Technology, Suzhou, CN;
Shaoyi Xu, Jiangsu, CN;
Zhencai Zhu, Jiangsu, CN;
Wei Li, Jiangsu, CN;
Yuqiao Wang, Jiangsu, CN;
Fangfang Xing, Jiangsu, CN;
Hongyu Xue, Jiangsu, CN;
Qiang Peng, Jiangsu, CN;
Feng Dong, Jiangsu, CN;
Guang Chen, Jiangsu, CN;
China University of Mining and Technology, Jiangsu, CN;
Abstract
Disclosed is a device and method for distributed detection of straightness of a working face of a scraper conveyor based on optical fiber sensing. The device includes a broadband light source, a first optical fiber circulator array, a second optical fiber circulator array, a collimator array, a reflecting film array, a third optical fiber circulator array, and an optical path analyzer. During transmission of light emitted from the broadband light source, the light with different wavelengths is separated via several optical gratings etched on a single-mode optical fiber (SMF), and reaches reflecting films adhered to the working face of the scraper conveyor through first optical fiber circulators, second optical fiber circulators, and collimators. The light with the different wavelengths is then reflected back from the reflecting films, enters the SMF through third optical fiber circulators, and finally enters the optical path analyzer.