The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Jun. 04, 2020
Applicant:
Jtekt Corporation, Osaka, JP;
Inventors:
Shuntaro Takasu, Hekinan, JP;
Yuki Ishigure, Gifu, JP;
Hisashi Otani, Anjo, JP;
Toshihiro Yonezu, Nishio, JP;
Assignee:
JTEKT CORPORATION, Osaka, JP;
Primary Examiner:
Int. Cl.
CPC ...
B23Q 17/09 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
B23Q 17/0957 (2013.01); G06N 20/00 (2019.01);
Abstract
An abnormality detection apparatus for working tools configured to be used in a machining process performed by a machine tool, the abnormality detection apparatus includes a storage portion which previously stores correlations between features of a plurality of operating portions relation to the machining process performed by the machine tool, and a tool condition of each of a plurality of working tool types, and a tool condition determining portion which determines the tool condition of the working tools based on the correlations.