The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Jun. 08, 2018
Hewlett-packard Development Company, L.p., Spring, TX (US);
Krzysztof Nauka, Palo Alto, CA (US);
John Samuel Dilip Jangam, Palo Alto, CA (US);
Seongsik Chang, Palo Alto, CA (US);
Hewlett-Packard Development Company, L.P., Spring, TX (US);
Abstract
An in-situ monitoring device for selective laser melting (SLM) additive manufacturing may include at least one coherent electromagnetic wave source to produce a detection beam, an interferometer interposed between the electromagnetic wave source and a target detection area, a photodetector to detect displacement measuring interference between electromagnetic waves from the electromagnetic wave source and reflected electromagnetic waves from the target detection area through the interferometer, and control logic to cause the detection beam to follow a print path of a material forming laser at a distance behind the material forming laser. The detection beam is placed on a laser-melted and at least partially solidified portion of a layer of a three-dimensional (3D) object formed by the material forming laser.