The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Jan. 29, 2019
Sysmex Corporation, Kobe, JP;
Hiroki Kotake, Kobe, JP;
Kenji Yoshimura, Kobe, JP;
Yuji Watanabe, Kobe, JP;
Masaki Shiba, Kobe, JP;
SYSMEX CORPORATION, Kobe, JP;
Abstract
A sample measuring system to reduce waste generated in a plurality of measurement units to be discarded to a common disposal unit while suppressing interference between measurement units due to waste disposal is provided. The sample measuring system includes a first measurement unit and a second measurement unit for measuring a sample, and a common disposal unit for storing waste generated from the first measurement unit and the second measurement unit. The first measurement unit includes a first disposal port connected to the disposal unit for discharging the waste generated in the first measurement unit. The second measurement unit includes a second disposal port connected to the disposal unit for discharging the waste generated in the second measurement unit.