The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Jul. 06, 2020
Shanghai United Imaging Healthcare Co., Ltd., Shanghai, CN;
SHANGHAI UNITED IMAGING HEALTHCARE CO., LTD., Shanghai, CN;
Abstract
The present application discloses a method for detecting an abnormity in an optical path or measuring and adjusting of a dynamic balance of a gantry in a CT system, comprising performing, by a gantry controlled by a controller, a test scan along an optical path of the CT system, the optical path being a path along which rays pass from a ray source to a detector. The method further comprises obtaining, by a processor, data relating to the test scan, and based on the data relating to the test scan. The method further comprises determining, by the processor, a status characteristic index of the optical path or an amount of dynamic imbalance of the gantry. The method further comprises analyzing, by the processor, a result of the status characteristic index; determining, by the processor, whether the optical path is abnormal, or determining whether a dynamic balance of the gantry satisfies a requirement based on a result of the analysis of the amount of dynamic imbalance.