The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Jul. 27, 2016
Fujifilm Corporation, Tokyo, JP;
Kaku Irisawa, Ashigarakami-gun, JP;
Atsushi Hashimoto, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Disclosed are a probe for photoacoustic measurement which can suppress generation of artifacts obstructive to signal observation in a photoacoustic measurement, and a photoacoustic measurement apparatus including the same. The probe for photoacoustic measurement includes a light emission unit which emits measurement light to a subject, and an acoustic wave detection unit which detects a photoacoustic wave generated in the subject by the emission of measurement light. An emission end surface of the light emission unit is positioned to a side where the acoustic wave detection unit is located, with respect to a contact plane of the probe, and an optical axis at the emission end surface is inclined to a side opposite to the side on which the acoustic wave detection unit is positioned with respect to a normal direction of a detection surface of the acoustic wave detection unit.