The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Jun. 26, 2020
Carl Zeiss Meditec Ag, Jena, DE;
Ralf Ebersbach, Schmölin, DE;
Martin Hacker, Jena, DE;
Gerard Antkowiak, Jena, DE;
Peter Klopfleisch, Jena, DE;
Ferid Bajramovic, Mamming, DE;
Tobias Bühren, Ulm, DE;
Matthias Reich, Jena, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A device for determining biometric variables of the eye, as are incorporated in the calculation of intraocular lenses including a multi-point keratometer and an OCT arrangement. The keratometer measurement points are illuminated telecentrically and detected telecentrically and the OCT arrangement is designed as a laterally scanning swept-source system with a detection region detecting the whole eye over the whole axial length thereof. The multi-point keratometer ensures that a sufficient number of keratometer points are available for measuring the corneal surface. By contrast, telecentricity ensures that the positioning inadequacies of the measuring instrument in relation to the eye to be measured do not lead to a local mismatch of the reflection points. The swept-source OCT scan detects the whole eye over the length thereof so that both anterior chamber structures and retina structures can be detected and a consistent whole eye image can be realized.