The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Apr. 30, 2019
Applicants:
University of Rochester, Rochester, NY (US);
The University of Arizona, Tucson, AZ (US);
Inventors:
Jinxin Huang, Rochester, NY (US);
Jannick P. Rolland, Pittsford, NY (US);
Eric Clarkson, Tucson, AZ (US);
Matthew Kupinski, Tucson, AZ (US);
Assignees:
University of Rochester, Rochester, NY (US);
The University of Arizona, Tucson, AZ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 (2006.01); A61B 3/00 (2006.01); A61B 3/113 (2006.01);
U.S. Cl.
CPC ...
A61B 3/101 (2013.01); A61B 3/0025 (2013.01); A61B 3/102 (2013.01); A61B 3/113 (2013.01);
Abstract
Systems and methods for assessing multi-layer structures in which a spectrum array is generated from low coherence interferometry and input into a statistical estimator, which determines the thickness and layer number based on the inputted spectrum and other information, including information about a source intensity noise, Poisson noise, and dark noise associated with the low coherence interferometry.