The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 02, 2022
Filed:
Jul. 01, 2019
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventors:
Masato Yoshioka, Kanagawa, JP;
Takeichi Tatsuta, Kanagawa, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 1/06 (2006.01); A61B 1/04 (2006.01); G02B 23/24 (2006.01); A61B 1/00 (2006.01);
U.S. Cl.
CPC ...
A61B 1/0676 (2013.01); A61B 1/04 (2013.01); A61B 1/0623 (2013.01); A61B 1/0638 (2013.01); G02B 23/2461 (2013.01); A61B 1/00009 (2013.01); A61B 1/00045 (2013.01);
Abstract
An auxiliary measurement light-emitting unit emits auxiliary measurement light that is planar light including at least two first feature lines. A taken image obtained through the imaging of a subject includes an intersection curve and at least two first spots that are formed at positions corresponding to first feature lines on the intersection curve. Measurement information representing the actual size of the subject is displayed in the taken image by using the positions of the first spots.