The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2022

Filed:

May. 08, 2020
Applicant:

Shanghai Jiao Tong University, Shanghai, CN;

Inventors:

Ke Ma, Shanghai, CN;

Ye Zhu, Shanghai, CN;

Jiayang Lin, Shanghai, CN;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 17/082 (2006.01); G01R 31/26 (2020.01); H02H 3/20 (2006.01);
U.S. Cl.
CPC ...
H03K 17/0822 (2013.01); G01R 31/2621 (2013.01); H02H 3/207 (2013.01); H03K 2217/0027 (2013.01);
Abstract

An online monitoring system for measuring the on-state voltage drop of power semiconductor devices comprises a voltage withstanding circuit and a voltage clamping circuit, one terminal of the voltage withstanding circuit is connected to one terminal of the voltage clamping circuit, and the other terminals of the voltage withstanding circuit and the voltage clamping circuit are randomly connected to two terminals of the power semiconductor device under test (DUT) respectively. The two terminals of the voltage clamping circuit are output terminals of the online monitoring system. A clamping voltage of the voltage clamping circuit is higher than the on-state voltage drop of the DUT. When the DUT is off, the output voltage of the system is fixed to the clamping voltage, and when it is on, the output voltage is not clamped. The system has simplified structure and enables convenient, accurate and low-cost measurement of on-state voltage drop.


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