The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2022

Filed:

Mar. 26, 2021
Applicant:

Microchip Technology Inc., Chandler, AZ (US);

Inventors:

Lorenzo Zuolo, Lusia, IT;

Rino Micheloni, Turate, IT;

Assignee:

Microchip Technology Inc., Chandler, AZ (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/42 (2006.01); G11C 29/44 (2006.01); G11C 29/12 (2006.01); G06K 9/62 (2022.01); G06N 3/063 (2006.01); G11C 29/50 (2006.01);
U.S. Cl.
CPC ...
G11C 29/42 (2013.01); G06K 9/6256 (2013.01); G06N 3/063 (2013.01); G11C 29/12005 (2013.01); G11C 29/44 (2013.01); G11C 29/50004 (2013.01); G11C 2029/1202 (2013.01);
Abstract

A method and apparatus for determining when actual wear of a flash memory device differs from a reliability state. Configuration files of a reliability-state classification neural network model are stored. The operation of a flash memory device is monitored to identify current physical characteristic values. A read of the flash memory device is performed to determine a number of errors. A neural network operation is performed using as input a set of threshold voltage shift offset values currently being used to perform reads of the flash memory device and the calculated number of errors, to identify a predicted reliability state. The identified current physical characteristic values are compared to corresponding tags associated with the predicted reliability state and a flag or other indication is stored when the comparison indicates that the identified current physical characteristic values do not correspond to the respective tags associated with the predicted reliability state.


Find Patent Forward Citations

Loading…