The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2022

Filed:

Sep. 05, 2017
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Tatsuya Komatsu, Tokyo, JP;

Reishi Kondo, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); G06N 7/00 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G06F 17/18 (2013.01); G05B 23/02 (2013.01); G06N 7/00 (2013.01);
Abstract

An anomaly detecting device according to the present invention includes: a memory; and at least one processor coupled to the memory. The processor performs operations. The operations includes: when first series data are input, extracting a series feature amount being a feature amount of a signal included in the first series data; calculating a series probability distribution being a probability distribution which the series feature amount follows; storing a reference probability distribution being a probability distribution designated as a reference for the series feature amount in the first series data; calculating a state feature amount representing a fluctuation condition of the series probability distribution with respect to the reference probability distribution; and detecting an anomaly of the first series data, based on a plurality of the state feature amounts calculated from the first series data.


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