The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2022
Filed:
May. 30, 2016
Beijing Yutong Intelligence Technology Co., Ltd., Beijing, CN;
Qin Zhang, Beijing, CN;
Zhan Zhang, Beijing, CN;
BEIJING YUTONG INTELLIGENCE TECHNOLOGY CO., LTD., Beijing, CN;
Abstract
Provided is a method for ordering X-type variables having states to be measured in a dynamic uncertain causality graph (DUCG). The method comprises: step 1: determining, on the basis of a DUCG simplified using E(y) as a condition, a measurable X-type variable having a state to be measured, an index set thereof being S x(y), where y is a time series; step 2: if there is only one element in S x(y), ending ordering; step 3: calculating ranking importance I(y) for X(i∈S x(y)); step 4: ranking X(i∈S x(y)) according to the ranking importance I i(y), and performing state measurement on an X-type variable of i∈S x(y) by referring to the ranking; and step 5: adding 1 to y, and repeating steps 1-5 until there is no X-type variable to be measured. The technical solution of the invention can quickly diagnose a cause of an object system abnormality at minimum cost, and effectively returns the object system to normal.