The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2022
Filed:
Nov. 25, 2020
Amazon Technologies, Inc., Seattle, WA (US);
Bo Pang, Seattle, WA (US);
Qijia Chen, Seattle, WA (US);
Leslie Johann Lamprecht, Seattle, WA (US);
Mohit Gupta, Seattle, WA (US);
Letian Feng, Clyde Hill, WA (US);
Roberto Pentz De Faria, Sammamish, WA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
Techniques for a service provider network to allow users to quickly and easily establish a testing environment to test various virtual machine (VM) instance types for hosting their workloads. Rather than identifying and recommending optimized VM instance types for hosting workloads of users, the techniques allow for users to initially test the VM instance types and determine how well their workloads perform on the VM instance types. Users can quickly and easily (e.g., 'one-click' input) request that a testing environment be established. The optimization service can then test one or more recommended VM instance types for the users' workloads in the testing environment. The optimization service can monitor the performance of the VM instance types while they host the 'test workloads,' and provide the users with performance metrics to help them decide if they would like to migrate their workloads to the recommended VM instance types.