The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2022

Filed:

Feb. 24, 2017
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Munetoshi Unuma, Tokyo, JP;

Junsuke Fujiwara, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 11/273 (2006.01); G06F 16/245 (2019.01); G06F 11/34 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G06F 11/273 (2013.01); G06F 16/245 (2019.01); G05B 23/0294 (2013.01); G06F 11/3089 (2013.01); G06F 11/3452 (2013.01);
Abstract

The abnormality diagnosis system detects a failure sign of a device to be diagnosed. The abnormality diagnosis system includes: a diagnosis process search unit which searches for a suitable diagnosis processing procedure by comparing a plurality of diagnosis processing procedures, and outputs reconfiguration information corresponding to the suitable diagnosis processing procedure; and a diagnosis processing unit which has a reconfigurable processing unit and which uses the suitable diagnosis processing procedure found by the diagnosis process search unit to detect a failure sign of the device to be diagnosed by reconfiguring the processing unit on the basis of the reconfiguration information.


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