The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2022
Filed:
Jun. 26, 2020
Applicant:
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Inventors:
Tipper Truong, San Jose, CA (US);
Joseph Brandt, Salt Lake City, UT (US);
Philip Shilane, Newtown, PA (US);
Assignee:
EMC IP Holding Company LLC, Hopkinton, MA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/14 (2006.01); G06F 16/17 (2019.01); G06F 16/16 (2019.01);
U.S. Cl.
CPC ...
G06F 11/1453 (2013.01); G06F 11/1435 (2013.01); G06F 11/1464 (2013.01); G06F 11/1469 (2013.01); G06F 16/162 (2019.01); G06F 16/1734 (2019.01); G06F 2201/80 (2013.01);
Abstract
Described is a system for detecting corruption in a deduplicated object storage system accessible by one or more microservices while minimizing costly read operations on objects. A testing tool inserts object corruptions in object storage. A verification path is performed by a controller module and one or more worker nodes. The testing tool verifies whether the executed verification path accurately detected the testing tool's inserted object corruptions.