The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2022
Filed:
Jan. 22, 2018
Siemens Aktiengesellschaft, Munich, DE;
Amit Chakraborty, East Windsor, NJ (US);
Chao Yuan, Plainsboro, NJ (US);
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A computer-implemented method for performing machine condition monitoring for fault diagnosis includes collecting multivariate time series data from a plurality of sensors in a machine and partitioning the multivariate time series data into a plurality of segment clusters. Each segment cluster corresponds to one of a plurality of class labels related to machine condition monitoring. Next, the segment clusters are clustered into segment cluster prototypes. The segment clusters and the segment cluster prototypes are used to learn a discriminative model that predicts a class label. Then, as new multivariate time series data is collected from the sensors in the machine, the discriminative model may be used to predict a new class label corresponding to segments included in the new multivariate time series data. If the new class label indicates a potential fault in operation of the machine, a notification may be provided to one or more users.