The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2022

Filed:

Jun. 11, 2021
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Kimio Hayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/08 (2006.01); G06F 3/12 (2006.01); G06T 7/00 (2017.01); H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
G06F 3/1208 (2013.01); G06F 3/1256 (2013.01); G06T 7/001 (2013.01); H04N 1/00018 (2013.01); H04N 1/00045 (2013.01); H04N 1/00076 (2013.01); H04N 1/00082 (2013.01); G06T 2207/30144 (2013.01); G06T 2207/30168 (2013.01);
Abstract

An inspection apparatus that inspects the quality of a printed product printed by a print apparatus receives information indicating a reference image, from an information processing apparatus that transmits a print job to the print apparatus. The inspection apparatus acquires the reference image based on the information indicating the reference image. The inspection apparatus receives from the print apparatus a scanned image of the printed product printed based on the print job received from the information processing apparatus, and inspects the quality of the printed product based on a comparison between the received scanned image and the acquired reference image.


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