The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2022
Filed:
Feb. 24, 2020
Fujifilm Corporation, Tokyo, JP;
Kenta Matsubara, Kanagawa, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An observation apparatus, an observation method, and an observation program capable of capturing an image by appropriately adjusting a focus regardless of a size of an effective range in which a distance to a cultivation container can be measured within a field of view are provided. An observation apparatus includes an imaging unitthat images an observation target in a field of view smaller than an accommodation partat a series of imaging positions and acquires a series of partial images, a measurement unitthat measures a distance from the imaging unitto the accommodation part, a storage unitthat stores shape information of a containerand a series of imaging position information, a calculation unitthat calculates effective range information indicating an effective range in which the measurement unitis capable of performing measurement before imaging within a field of view of the imaging unitat the imaging positions, based on the shape information and the imaging position information, and a control unitthat controls a focus of the imaging unitusing a measurement result measured by the measurement unitin the effective range and a measurement result of the measurement unitin a field of view adjacent to the field of view including the effective range in a case where the effective range is smaller than or equal to a threshold value.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile