The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2022
Filed:
Mar. 02, 2018
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Benedict Diederich, Jena, DE;
Rolf Wartmann, Waake, DE;
Harald Schadwinkel, Hannover, DE;
Lars Stoppe, Jena, DE;
Assignee:
Cad Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/14 (2006.01); G01N 21/41 (2006.01); G02B 21/08 (2006.01);
U.S. Cl.
CPC ...
G02B 21/14 (2013.01); G01N 21/41 (2013.01); G02B 21/082 (2013.01); G01N 2021/418 (2013.01); G01N 2021/4186 (2013.01);
Abstract
An object transfer function for a sample object is determined on the basis of a reference measurement. Subsequently, an optimization is carried out in order to find an optimized illumination geometry on the basis of the object transfer function and an optical transfer function for an optical unit.