The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2022
Filed:
Jan. 21, 2020
Saudi Arabian Oil Company, Dhahran, SA;
Daniele Colombo, Dhahran, SA;
Diego Rovetta, Delft, NL;
Apostolos Kontakis, Delft, NL;
Ernesto Sandoval Curiel, Dhahran, SA;
Saudi Arabian Oil Company, Dhahran, SA;
Abstract
Methods for full waveform inversion (FWI) in the midpoint-offset domain include using a computer system to sort seismic traces into common midpoint-offset bins (XYO bins). For each XYO bin, a linear moveout correction is applied to a collection of seismic traces within the XYO bin. The collection of seismic traces is stacked to form a pilot trace. The computer system determines a surface-consistent residual static correction for each seismic trace. The computer system determines that the surface-consistent residual static correction for each seismic trace is less than a threshold. Responsive to the determining that the surface-consistent residual static correction is less than the threshold, the computer system stacks the collection of seismic traces to provide the pilot trace. The computer system groups the pilot traces for the XYO bins into a set of virtual shot gathers. The computer system performs one-dimensional FWI based on each virtual shot gather.