The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2022
Filed:
Aug. 25, 2015
Applicant:
Sysmex Corporation, Kobe, JP;
Inventors:
Assignee:
SYSMEX CORPORATION, Kobe, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/02 (2006.01); G01N 35/04 (2006.01); G01N 21/78 (2006.01); G01N 21/77 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00732 (2013.01); G01N 21/78 (2013.01); G01N 35/00 (2013.01); G01N 35/00871 (2013.01); G01N 35/026 (2013.01); G01N 35/04 (2013.01); G01N 35/02 (2013.01); G01N 2021/7759 (2013.01); G01N 2035/00326 (2013.01); G01N 2035/00831 (2013.01); G01N 2035/00851 (2013.01); G01N 2035/00881 (2013.01); G01N 2035/0465 (2013.01); G01N 2035/0491 (2013.01); G01N 2201/025 (2013.01); G01N 2201/061 (2013.01);
Abstract
Provided is a test system operable with a simplified structure. A test system includes a first test device and a second test device each of which transports and tests a sample. The test device includes a master control unit, which performs assignment of samples to the first test device and the second test device, and control of a transport operation of the sample assigned to the test device. The test device includes a slave control unit, which controls a transport operation of the sample assigned to the test device by the master control unit.