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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11397190 B1

PDFFull Text
Date of Patent:
Jul. 26, 2022

Filed:

Aug. 25, 2015

Test system

Applicant:

Sysmex Corporation, Kobe, JP;

Inventors:

Nobuyoshi Yamakawa, Kobe, JP;

Hiroo Tatsutani, Kobe, JP;

Yuichiro Ohmae, Kobe, JP;

Assignee:

SYSMEX CORPORATION, Kobe, JP;

Attorney:

Metrolex IP Law Group, PLLC

Primary Examiner:

Kathryn Wright

Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/02 (2006.01); G01N 35/04 (2006.01); G01N 21/78 (2006.01); G01N 21/77 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00732 (2013.01); G01N 21/78 (2013.01); G01N 35/00 (2013.01); G01N 35/00871 (2013.01); G01N 35/026 (2013.01); G01N 35/04 (2013.01); G01N 35/02 (2013.01); G01N 2021/7759 (2013.01); G01N 2035/00326 (2013.01); G01N 2035/00831 (2013.01); G01N 2035/00851 (2013.01); G01N 2035/00881 (2013.01); G01N 2035/0465 (2013.01); G01N 2035/0491 (2013.01); G01N 2201/025 (2013.01); G01N 2201/061 (2013.01);
Abstract

Provided is a test system operable with a simplified structure. A test system includes a first test device and a second test device each of which transports and tests a sample. The test device includes a master control unit, which performs assignment of samples to the first test device and the second test device, and control of a transport operation of the sample assigned to the test device. The test device includes a slave control unit, which controls a transport operation of the sample assigned to the test device by the master control unit.

Find Patent Forward Citations

Yamakawa, Nobuyoshi. (2022). Test system (U.S. Patent No. 11397190). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11397190

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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