The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 26, 2022
Filed:
Dec. 05, 2017
Otsuka Pharmaceutical Co., Ltd., Tokyo, JP;
Youichi Aoki, Toda, JP;
Tetsuya Noda, Hino, JP;
OTSUKA PHARMACEUTICAL CO., LTD., Tokyo, JP;
Abstract
Presently disclosed is a way to provide a measuring device capable of easily detecting measurement abnormality without increasing load in hardware. The measuring device may include: an emission means that may emit light to a measurement target region; a light measurement means that may measure light output from the measurement target region by emission with the emission means; a driving means that may move a position of at least one of the measurement target region and the emission means; and a determination means that may compare measurement values of the light measured a plurality of times by the light measurement means while changing positions of the measurement target region by the driving means and thereby determines abnormality of a measurement result. The determination means may determine measurement abnormality in a case where a reference measurement value being a measurement value obtained for a first time is lower than a comparison measurement value being a highest measurement value among measurement values obtained for second and subsequent times.