The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 26, 2022

Filed:

Jul. 24, 2018
Applicant:

Safran, Paris, FR;

Inventors:

Samuel Louis Marcel Marie Maillard, Moissy-Cramayel, FR;

Lionel Christian Jean-Loïc Gay, Moissy-Cramayel, FR;

Thierry Patrick Maurice Chauvin, Moissy-Cramayel, FR;

Benoît Bazin, Moissy-Cramayel, FR;

Thomas Bernd Paulo Viassone, Moissy-Cramayel, FR;

Assignee:

Safran, Paris, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/08 (2022.01); G01J 5/04 (2006.01); G01J 5/00 (2022.01); F03D 17/00 (2016.01);
U.S. Cl.
CPC ...
G01J 5/0896 (2013.01); G01J 5/045 (2013.01); F03D 17/00 (2016.05); G01J 2005/0077 (2013.01);
Abstract

The invention relates to a thermographic system comprising infrared imaging means, a radiation source and a duct () for guiding the radiation in a longitudinal direction (L) to an outlet of the duct () located at a free edge () thereof, characterized in that the free edge () of the duct () is deformable along the longitudinal axis (L) in a first direction (L) oriented from the outlet of the duct () towards the imaging means () and in that it comprises means for returning the free edge to its initial shape and means for holding said free edge of the duct () in a deformed state.


Find Patent Forward Citations

Loading…