The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 19, 2022

Filed:

Jul. 28, 2020
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Inventors:

Roberto Mecca, Cambridge, GB;

Roberto Cipolla, Cambridge, GB;

Fotios Logothetis, Cambridge, GB;

Assignee:

Kabushiki Kaisha Toshiba, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/122 (2018.01); G06T 7/586 (2017.01); H04N 13/239 (2018.01); H04N 13/111 (2018.01); H04N 13/282 (2018.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
H04N 13/122 (2018.05); G06T 7/586 (2017.01); H04N 5/2253 (2013.01); H04N 13/111 (2018.05); H04N 13/239 (2018.05); H04N 13/282 (2018.05); G06T 2207/10012 (2013.01);
Abstract

A system for producing a 3D image of an object, the system includes: a processor adapted to receive multiview stereo photometric data, the multiview photometric stereo data including a first set of image data, wherein the first set of image data includes images captured by the first camera at a plurality of positions with illumination from different illumination directions such that there are a plurality of images from a different illumination direction for each position of the first camera, the processor being adapted to process the multiview photometric stereo data using a photometric stereo approach with a formulation of the irradiance using a reflection model that models both diffuse and specular reflection.


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