The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 19, 2022
Filed:
Feb. 14, 2020
Applicant:
Fg Innovation Company Limited, Tuen Mun, HK;
Inventors:
Chia-Hao Yu, Yilan, TW;
Chia-Hung Wei, Hsinchu, TW;
Yu-Hsin Cheng, Hsinchu, TW;
Tsung-Hua Tsai, Hsinchu, TW;
Assignee:
FG Innovation Company Limited, Tuen Mun, HK;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 74/08 (2009.01); H04L 41/0654 (2022.01); H04W 72/12 (2009.01); H04L 1/18 (2006.01);
U.S. Cl.
CPC ...
H04L 41/0654 (2013.01); H04L 1/1812 (2013.01); H04W 72/1289 (2013.01);
Abstract
A method for SCell BFR performed by a UE is provided. The method includes: transmitting, to a base station, a BFR MAC CE that includes a cell index of an SCell in which beam failure occurs and a new candidate beam index for the SCell, the transmission of the BFR MAC CE associated with a HARQ process having a HARQ process ID; and receiving, from the base station, a first DCI format that schedules a first PUSCH transmission with the HARQ process ID, the first DCI format indicating a toggled NDI value.